Skip to content
CVE Tracker
Back

CVE-2018-11279

Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile…

High8.8EPSS 0.51%
Published
Updated
Reserved
Assigned by
qualcomm

Description

Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130

Scores

CVSS scores of CVE-2018-11279, by who scored it
Scored byCVSSScoreVector
NVDNVD · Modified3.0High8.8CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
EPSS (exploitation in 30 days)
0.51% · top 56% of all CVEs (4 Nov 2026)
Loading the EPSS history…

The list uses the assigner's score when there is one, then CISA's, then NVD's: High 8.8.

Weakness

Affected products

  • Qualcomm, Inc. · Snapdragon Automobile, Snapdragon Mobile, Snapdragon Wear

    • affected MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130

References (2)

Sources

The same CVE in the primary databases and aggregators, to check against.

Badge for a README or a ticket

CVE-2018-11279 badge
[![CVE-2018-11279](https://trackcve.app/badge/CVE-2018-11279.svg)](https://trackcve.app/cve/CVE-2018-11279)

Record last updated .