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CVE-2018-13888

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in…

High7.8EPSS 0.23%
Published
Updated
Reserved
Assigned by
qualcomm

Description

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.

Timeline

  1. ID reserved

    By qualcomm

  2. · 7 months later

    Published

  3. · 5 years later

    Record updated

Changes after publication (a new score, a public exploit, EPSS crossing 1, 10 or 50 %, leaving KEV) are kept since November 2026; earlier ones are not known.

Scores

CVSS scores of CVE-2018-13888, by who scored it
Scored byCVSSScoreVector
NVDNVD · Modified3.0High7.8CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
EPSS (exploitation in 30 days)
0.23% · top 86% of all CVEs (7 Nov 2026)
Loading the EPSS history…

The list uses the assigner's score when there is one, then CISA's, then NVD's: High 7.8.

Weakness

Affected products

References (2)

Sources

The same CVE in the primary databases and aggregators, to check against.

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Record last updated .