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CVE-2022-25697
Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile,…
High8.4EPSS 0.13%
- Published
- Updated
- Reserved
- Assigned by
- qualcomm
Description
Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables
Scores
| Scored by | CVSS | Score | Vector |
|---|---|---|---|
| qualcommCNA (assigner) | 3.1 | High8.4 | CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
| NVDNVD · Modified | 3.1 | High7.8 | CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H |
- EPSS (exploitation in 30 days)
- 0.13% · top 98% of all CVEs (6 Nov 2026)
- CISA SSVC
- Exploitation: none · Automatable: no · Technical impact: total
Loading the EPSS history…
The list uses the assigner's score when there is one, then CISA's, then NVD's: High 8.4.
Weakness
- Improper Input Validation in i2c Buses
- CWE-787 Out-of-bounds Write (opens in a new tab)All about CWE-787 and its CVEs
Affected products
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearables
- affected SD 8 Gen1 5G
- affected SD429
- affected SDA429W
- affected SDM429W
- affected WCD9380
- affected WCN3610
- affected WCN3620
- affected WCN3660B
- affected WCN3680B
- affected WCN3980
- affected WCN6855
- affected WCN6856
- affected WCN7850
- affected WCN7851
- affected WSA8830
- affected WSA8835
References (1)
Sources
The same CVE in the primary databases and aggregators, to check against.
- CVE.org record (opens in a new tab)
- CVE List JSON (GitHub) (opens in a new tab)
- NVD (opens in a new tab)
- FIRST EPSS (opens in a new tab)
- OSV.dev (opens in a new tab)
- GitHub Advisories (opens in a new tab)
- CIRCL Vulnerability-Lookup (opens in a new tab)
Badge for a README or a ticket
[](https://trackcve.app/cve/CVE-2022-25697)Record last updated .