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CVE-2022-35858
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory…
High7.8EPSS 0.40%
- Published
- Updated
- Reserved
- Assigned by
- mitre
Description
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Scores
| Scored by | CVSS | Score | Vector |
|---|---|---|---|
| NVDNVD · Modified | 3.1 | High7.8 | CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H |
- EPSS (exploitation in 30 days)
- 0.40% · top 66% of all CVEs (7 Nov 2026)
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The list uses the assigner's score when there is one, then CISA's, then NVD's: High 7.8.
Weakness
Affected products
n/a
- affected n/a
References (2)
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283 (opens in a new tab)x_refsource_MISCx_transferred
- https://github.com/Samsung/mTower/issues/71 (opens in a new tab)x_refsource_MISCx_transferred
Sources
The same CVE in the primary databases and aggregators, to check against.
- CVE.org record (opens in a new tab)
- CVE List JSON (GitHub) (opens in a new tab)
- NVD (opens in a new tab)
- FIRST EPSS (opens in a new tab)
- OSV.dev (opens in a new tab)
- GitHub Advisories (opens in a new tab)
- CIRCL Vulnerability-Lookup (opens in a new tab)
Badge for a README or a ticket
[](https://trackcve.app/cve/CVE-2022-35858)Record last updated .